Fault Zone Dynamic Processes: Evolution of Fault Properties During Seismic Rupture
- Marion Y. Thomas, Thomas M. Mitchell, Harsha S. Bhat
- ISBN : 9781119156888
- Publisher : John Wiley and Sons U.S.A.
- Publication Year : 2017
- Imprint : John Wiley & Sons
- CD Included : No
- Pages : 306
- Binding : Hardback
List Price : US$ 170.00
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